Adaptive multi-loop mode atomic force microscope imaging

Juan Ren, Qingze Zou, Bo Li, Zhiqun Lin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

An adaptive multi-loop mode (AMLM) imaging of atomic force microscope (AFM) is proposed. Due to its superior image quality and less sample disturbances, tapping mode (TM) imaging is currently the de facto most widely used imaging technique. However, the speed of TM-imaging is substantially limited, and becoming the major bottleneck of this technique. The proposed AMLM-imaging overcomes the limits of TM-imaging by utilizing control techniques to substantially increase the speed of TM-imaging while preserving the advantages of TM-imaging. The AMLM-imaging is tested and demonstrated through imaging a PtBA sample in experiments, and the experiment results demonstrated that the image quality over large-size imaging (50 μm by 25 μm) achieved at the scan rate of 25 Hz is at the same level of that when using TM-imaging at 1 Hz, while the probe-sample interaction force is smaller than that of the TM-imaging at 2.5 Hz.

Original languageEnglish
Title of host publicationActive Control of Aerospace Structure; Motion Control; Aerospace Control; Assistive Robotic Systems; Bio-Inspired Systems; Biomedical/Bioengineering Applications; Building Energy Systems; Condition Based Monitoring; Control Design for Drilling Automation; Control of Ground Vehicles, Manipulators, Mechatronic Systems; Controls for Manufacturing; Distributed Control; Dynamic Modeling for Vehicle Systems; Dynamics and Control of Mobile and Locomotion Robots; Electrochemical Energy Systems
PublisherAmerican Society of Mechanical Engineers
ISBN (Electronic)9780791846186
DOIs
StatePublished - 2014
EventASME 2014 Dynamic Systems and Control Conference, DSCC 2014 - San Antonio, United States
Duration: 22 Oct 201424 Oct 2014

Publication series

NameASME 2014 Dynamic Systems and Control Conference, DSCC 2014
Volume1

Conference

ConferenceASME 2014 Dynamic Systems and Control Conference, DSCC 2014
Country/TerritoryUnited States
CitySan Antonio
Period22/10/1424/10/14

Bibliographical note

Publisher Copyright:
Copyright © 2014 by ASME.

Fingerprint

Dive into the research topics of 'Adaptive multi-loop mode atomic force microscope imaging'. Together they form a unique fingerprint.

Cite this