Abnormal resistance switching behaviours of NiO thin films: Possible occurrence of both formation and rupturing of conducting channels

Chunli Liu, S. C. Chae, J. S. Lee, S. H. Chang, S. B. Lee, D. W. Kim, C. U. Jung, S. Seo, S. E. Ahn, B. Kahng, T. W. Noh

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