A universal core model for multiple-gate field-effect transistors. Part II: Drain current model

  • Juan Pablo Duarte
  • , Sung Jin Choi
  • , Dong Il Moon
  • , Jae Hyuk Ahn
  • , Jee Yeon Kim
  • , Sungho Kim
  • , Yang Kyu Choi

Research output: Contribution to journal › Article › peer-review

44 Scopus citations

Fingerprint

Dive into the research topics of 'A universal core model for multiple-gate field-effect transistors. Part II: Drain current model'. Together they form a unique fingerprint.

Engineering