Abstract
We propose a novel sensing circuitry based on the new cell structure. Proposed sense amplifier detects small voltage difference between two MTJ's and develops it to full rail-to-rail voltage while maintaining small voltage difference on TMR cells by limiting gate voltage of the switch transistor between a pair of bit lines and a sense amplifier. The sense amplifier is small enough to fit into each column that the whole data array on selected word line is activated as in DRAMs for high-speed read-out by changing column addresses only. We verified the new sensing scheme in a 0.35 μm logic technology.
Original language | English |
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Pages (from-to) | 19-24 |
Number of pages | 6 |
Journal | Current Applied Physics |
Volume | 4 |
Issue number | 1 |
DOIs | |
State | Published - Feb 2004 |
Keywords
- High speed
- MRAM
- Sense amplifier
- Synchronous