Abstract
In this paper, a novel planar probe structure is developed to evaluate the possibility of replacement of existing open-ended coaxial probes. The body of the probe is a planar transmission line that can propagate TEM mode and is completely shielded. For proper comparisons with open-ended coaxial probes, the proposed probe is designed to have a coaxial aperture on the top of the probe body using a via structure. The results of complex permittivity measurement show good agreement with those of open-ended coaxial probes. Furthermore, it can reduce the fabrication cost and simplify the fabrication process by adopting the photolithography technique. Therefore, the proposed planar type probe is a promising candidate for nondestructive dielectric measurement with respect to low cost and easier fabrication. In particular, it can be advantageous for in-vivo measurements due to its small size and disposability.
| Original language | English |
|---|---|
| Pages (from-to) | 1441-1444 |
| Number of pages | 4 |
| Journal | IEEE MTT-S International Microwave Symposium Digest |
| Volume | 3 |
| State | Published - 2004 |
| Event | 2004 IEEE MITT-S International Microwave Symposium Digest - Fort Worth, TX, United States Duration: 6 Jun 2004 → 11 Jun 2004 |
Keywords
- Biomedical application
- Dielectric measurement
- Photolithography
- Planar structure
- Probe