A high-temperature capable planar-type coaxial probe for complex permittivity measurements up to 40 GHz

Namgon Kim, Jeonghoon Yoon, Dongki Kim, Jeiwon Cho, Changyul Cheon, Youngwoo Kwon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

A planar-type probe applicable to a wide temperature and frequency range has been developed. The probe employs a low CTE (Coefficient of Thermal Expansion) dielectric material to minimize the effect of thermal expansion for high temperature measurement. Additionally, the coaxial aperture dimensions have been optimized through sensitivity analysis to minimize the uncertainty of the extracted complex permittivity due to variations of the measured S-parameters. Also, the error correction method was used at extreme temperatures to compensate for the effects of the excessive thermal expansion. For validation, distilled water was measured from 0 °C to 100 °C in the frequency range of 0.5-40GHz. The measured complex permittivity shows good agreement with the reference data up to 75 °C without the error correction and up to the boiling point (92 °C) with the error correction. To our knowledge, this is the first demonstration of low-cost planar-type probes capable of high temperature operation.

Original languageEnglish
Title of host publication2007 IEEE MTT-S International Microwave Symposium Digest
Pages519-522
Number of pages4
DOIs
StatePublished - 2007
Event2007 IEEE MTT-S International Microwave Symposium, IMS 2007 - Honolulu, HI, United States
Duration: 3 Jun 20078 Jun 2007

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
ISSN (Print)0149-645X

Conference

Conference2007 IEEE MTT-S International Microwave Symposium, IMS 2007
Country/TerritoryUnited States
CityHonolulu, HI
Period3/06/078/06/07

Keywords

  • Coaxial aperture
  • Complex permittivity
  • High temperature
  • Planar-type probe
  • Thermal expansion

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