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A comparison study on multilayered barrier oxide structure in charge trap flash for synaptic operation

  • Minkyung Kim
  • , Eunpyo Park
  • , In Soo Kim
  • , Jongkil Park
  • , Jaewook Kim
  • , Yeonjoo Jeong
  • , Suyoun Lee
  • , Inho Kim
  • , Jong Keuk Park
  • , Tae Yeon Seong
  • , Joon Young Kwak

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

A synaptic device that contains weight information between two neurons is one of the essential components in a neuromorphic system, which needs highly linear and symmetric characteristics of weight update. In this study, a charge trap flash (CTF) memory device with a multilayered high-κ barrier oxide structure on the MoS2 channel is proposed. The fabricated device was oxide-engineered on the barrier oxide layers to achieve improved synaptic functions. A comparison study between two fabricated devices with different barrier oxide materials (Al2O3 and SiO2 ) suggests that a high-κ barrier oxide structure improves the synaptic operations by demonstrating the increased on/off ratio and symmetry of synaptic weight updates due to a better coupling ratio. Lastly, the fabricated device has demonstrated reliable potentiation and depression behaviors and spike-timing-dependent plasticity (STDP) for use in a spiking neural network (SNN) neuromorphic system.

Original languageEnglish
Article number70
Pages (from-to)1-7
Number of pages7
JournalCrystals
Volume11
Issue number1
DOIs
StatePublished - Jan 2021

Bibliographical note

Publisher Copyright:
© 2021 by the authors. Licensee MDPI, Basel, Switzerland.

Keywords

  • Charge trap flash
  • MoS
  • Multilayered oxide film
  • Neuromorphic
  • Synaptic device

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