A band-engineered one-transistor DRAM with improved data retention and power efficiency

Eunseon Yu, Seongjae Cho, Hyungsoon Shin, Byung Gook Park

Research output: Contribution to journalArticlepeer-review

18 Scopus citations


In this letter, a one-transistor (1T) dynamic random-access memory (DRAM) with SiGe quantum well (QW) is proposed, and its performance is validated through the technology computer-aided design (TCAD) simulation. At the write operation, band-to-band tunneling is used and 1 V or lower programming voltage is realized by inserting the SiGe QW beside the drain. This QW also functions as the storage node, which enhances not only the current sensing margin but also the retention time (τret) compared with those of all-Si device. At an extremely scaled cell size and sub-10-ns write/erase operations, the proposed device shows 0.2-s-long τret and current ratio > 104. It has been verified that a single cycle of 1T DRAM operations consumes only 93.8 fJ.

Original languageEnglish
Article number8654635
Pages (from-to)562-565
Number of pages4
JournalIEEE Electron Device Letters
Issue number4
StatePublished - Apr 2019

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  • DRAM retention
  • One-transistor DRAM
  • SiGe quantum well
  • band-to-band tunneling
  • low-power operation


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