TY - GEN
T1 - A 2-D translational pinhole formed by two orthogonally moving micro-slits
AU - Chronis, N.
AU - Okandan, M.
AU - Baker, M.
AU - Lee, L. P.
PY - 2005
Y1 - 2005
N2 - Pinhole alignment is a tedious procedure that strongly affects the overall performance of an optical system. In order to address this critical issue, we developed a 2-D translational pinhole, which is formed by two orthogonally moving micro-slits. The MEMS pinhole, fabricated by a modified SUMMIT-V process, can be positioned within a range of 30×30 microns in the XY plane. Alternatively, it can be used in a scanning mode at driving frequencies up to -200Hz without any noticeable amplitude decrease. Typical applications include confocal scanning opthalmoscopes, laser beam profilers, and MEMS confocal microscopes.
AB - Pinhole alignment is a tedious procedure that strongly affects the overall performance of an optical system. In order to address this critical issue, we developed a 2-D translational pinhole, which is formed by two orthogonally moving micro-slits. The MEMS pinhole, fabricated by a modified SUMMIT-V process, can be positioned within a range of 30×30 microns in the XY plane. Alternatively, it can be used in a scanning mode at driving frequencies up to -200Hz without any noticeable amplitude decrease. Typical applications include confocal scanning opthalmoscopes, laser beam profilers, and MEMS confocal microscopes.
KW - Confocal microscopy
KW - MEMS pinhole
KW - Moving micro-slit
KW - Translational pinhole
UR - http://www.scopus.com/inward/record.url?scp=27544436388&partnerID=8YFLogxK
U2 - 10.1109/SENSOR.2005.1496629
DO - 10.1109/SENSOR.2005.1496629
M3 - Conference contribution
AN - SCOPUS:27544436388
SN - 0780389948
SN - 9780780389946
T3 - Digest of Technical Papers - International Conference on Solid State Sensors and Actuators and Microsystems, TRANSDUCERS '05
SP - 1022
EP - 1025
BT - TRANSDUCERS '05 - 13th International Conference on Solid-State Sensors and Actuators and Microsystems - Digest of Technical Papers
T2 - 13th International Conference on Solid-State Sensors and Actuators and Microsystems, TRANSDUCERS '05
Y2 - 5 June 2005 through 9 June 2005
ER -